ISSN   1004-0595

CN  62-1224/O4

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退火温度对a-Si:C薄膜结构及摩擦学性能的影响

Influence of Annealing Temperature on Structure and Tribological Properties of a-Si:C Films

  • 摘要: 以高纯SiC作为靶材,C2H2和Ar作为源气体,采用脉冲反应磁控溅射技术制备了a-Si:C薄膜,并对薄膜进行大气环境中不同温度退火处理(25~500 ℃),分析探索了退火温度对于a-Si:C薄膜形貌、微结构、力学性能和摩擦学行为的作用规律以及a-Si:C薄膜的摩擦磨损机理. 研究发现:退火温度较低时(≤ 200 ℃),a-Si:C薄膜的结构几乎不变,硬度(H)和弹性模量(E)先增加后减小,内应力线性增加,相应地,薄膜的磨损率先减小后增加. 此外,由于石墨化转移层的形成,薄膜的摩擦系数减小. 在300 ℃下退火,薄膜的结构仍未发生明显变化,内应力、HE稍微降低,摩擦系数稍微增加,磨损无显著变化;400和500 ℃退火后,薄膜发生了石墨化和氧化,结构出现明显变化,摩擦性能提高. 分析表明,大气环境中不同温度退火后薄膜结构、力学性能的变化以及摩擦过程中转移层的形成保证了薄膜良好的摩擦学特性,相关结果为a-Si:C薄膜的结构性能调控和工程应用提供了参考.

     

    Abstract: a-Si:C films as protective coating have been attracting more and more attentions due to prominent characteristic such as good thermal stability, excellent wear resistant and corrosion resistant. For the different sliding parts applications, a-Si:C films often subjected to localized heating caused by friction in ambient air. Thus, it is interesting to study these films’ thermal stability and the mechanism of the low friction coefficient. Here, a-Si:C films were deposited by pulsed reactive magnetron sputtering in a gas mixture of Ar and C2H2. The effects of annealing temperature (25~100 ℃) on morphology, microstructure, mechanical properties and tribological performance were studied. The result showed that as-deposited a-Si:C films displayed a typical amorphous structure and the cross-sectional morphologies of a-Si:C films were uniform and compact, and there were no obvious cracks. No indications of discontinuities were observed between the a-Si:C film and substrate/transition layer. After annealing at lower temperature (≤ 200 ℃), the structure of a-Si:C films had no significant change, but the internal stress lineally increased, and the maximum value was 2.8 GPa at 200 ℃. Hardness (H) and elastic modulus (E) firstly increased to 18.13 GPa and 167.74 GPa at 100 ℃ from 4.14 GPa and 97.61 GPa at 25 ℃, respectively, and then decreased to 18.13 GPa and 167.74 GPa at 200 ℃. These parameters, in turn, determined the wear rate. Accordingly, the wear rate initially decreased and then increased. The films annealed at 100 ℃ exhibited the lowest wear rate due to excellent mechanical properties where the maximum values of H/E and H3/E2 were obtained. The sample annealed at 200 ℃ exhibited the highest wear rate, possibly owing to its elevated internal stress. Moreover, the friction coefficient decreased due to the formation of graphitization transfer layer. At an annealing temperature of 300 ℃, the structure of films still remained the same, but the internal stress, H and E decreased slightly. Although the friction coefficient slightly increased due to surface roughening, the films showed good wear resistance, attributed to the presence of Si-C bonds that maintained structural stability. Upon annealing at higher temperatures (400 and 500 ℃), an increase in sp2-C content and surface oxidation was observed, and the higher annealing temperature, the more serious graphitization and oxidation was. Specially, a decreased thickness and loose oxidation layer were obtained at annealing temperature of 500 ℃. The internal stress, H and E decreased, and dropped sharply when annealing temperature increased to 500 ℃ from 400 ℃. But a lower friction coefficient and wear rate were achieved, resulting from the formation of a transfer film primarily composed of carbon generated from the reactions between Si-C, Si-O-C, Si-O and C-C. The relevant results provided reference for structure and property regulation and engineering application of a-Si:C films.

     

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