ISSN   1004-0595

CN  62-1224/O4

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基于斜面的摩擦力显微镜探针扭转系数标定改进方法

Improved Calibration Method of Tip Torsion Coefficient on Friction Force Microscope by Using a Slope

  • 摘要: 基于标准样品的已知斜面,对摩擦力显微镜探针扭转系数标定方法进行改进. 根据探针在斜面上滑动时的受力特点,测试不同载荷下斜面上摩擦力环电压信号的半高量和偏移量,求解摩擦系数并最后得出探针扭转系数. 结果表明:斜面摩擦力信号的半高量和偏移量随着载荷的增大而增加,且在较高载荷下呈线性增长;在此前提下黏着力不影响摩擦系数和扭转系数的求解;平面验证试验所得摩擦系数与上述求解值基本一致. 相关结果有望简化纳米尺度摩擦力的标定和测试.

     

    Abstract: By using a slope on standard sample, an improved method about calibration of tip torsion coefficient on friction force microscope was proposed. Based on forces exerted on the slope during sliding, the half-height and offset of friction-loop on slope was measured under different loads. Then the friction coefficient could be solved and the torsion coefficient could be calculated. Results show that the half-height and offset of friction-loop on slope increased linearly under higher load range. On this basis, solving of friction coefficient and torsion coefficient was independent on the adhesion force. After calibration, the verifying tests on flat suggested that the measured friction coefficient was similar to the solved one. These results may be beneficial to the calibration and measurement of friction force in nanoscale.

     

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